Dr. Xiaopu Zhang, a Chinese researcher in Prof. John Boland's group in CRANN, Trinity College Dublin, published a research paper in Science. The paper reported the grain rotation and surface tilting induced by the grain boundary relaxation in nanocrystalline copper films, which is a completely new observation using a scanning tunneling microscope. The phenomena could impact electrical, thermal and reliable properties of copper nanowires in smartphone chips and hence the efficiency of electronics. The fundamental mechanism uncovered will help material design and engineering in future. Paper can be accessed in http://science.sciencemag.org/content/357/6349/397